{"id":2861,"date":"2013-09-17T13:26:09","date_gmt":"2013-09-17T04:26:09","guid":{"rendered":"https:\/\/pr-app02.eng.hokudai.ac.jp\/others\/newsfeed\/?p=2861"},"modified":"2026-07-03T08:15:56","modified_gmt":"2026-07-02T23:15:56","slug":"prize20130917_05","status":"publish","type":"topics","link":"https:\/\/pr.eng.hokudai.ac.jp\/top\/topics\/prize20130917_05\/","title":{"rendered":"\u5800\u7950\u81e3\u3055\u3093(\u535a\u58eb3\u5e74)\u304c10th International Conference on Nitride Semiconductors (ICNS)\u306eOutstanding Poster Presentation Award\u3092\u53d7\u8cde\u3057\u307e\u3057\u305f\u3002"},"content":{"rendered":"\n<p class=\"wp-block-paragraph\">\u53d7\u8cde\u65e5\uff1a\u30002013\u5e748\u670826\u65e5<br>\u6c0f\u540d\uff1a\u3000\u5800\u3000\u7950\u81e3<br>\u5b66\u5e74\uff1a\u3000\u535a\u58eb3\u5e74<br>\u6240\u5c5e\uff1a\u3000\u5927\u5b66\u9662\u60c5\u5831\u79d1\u5b66\u7814\u7a76\u79d1 \u60c5\u5831\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u5c02\u653b \u91cf\u5b50\u60c5\u5831\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u8b1b\u5ea7 <a href=\"http:\/\/www.rciqe.hokudai.ac.jp\/qcp\/index.html\">\u91cf\u5b50\u7d50\u6676\u30d5\u30a9\u30c8\u30cb\u30af\u30b9\u7814\u7a76\u5ba4<\/a><br>\u6388\u4e0e\u56e3\u4f53\uff1a\u3000<a href=\"http:\/\/www.mrs.org\/icns-10-poster-winners\/\">10th International Conference on Nitride Semiconductors (ICNS)<\/a><br>\u8cde\u540d\uff1a\u3000Outstanding Poster Presentation Award<br>\u53d7\u8cde\u8ad6\u6587\u540d\uff0c\u7814\u7a76\u984c\u76ee\u540d\u307e\u305f\u306f\u53d7\u8cde\u7406\u7531\uff1a<br>\uff62Characterization and Control of MOS Interface States in GaN-based MOS-HEMTs Using Al2O3 Gate Insulator\uff08Al2O3\u30b2\u30fc\u30c8\u7d76\u7e01\u819c\u3092\u7528\u3044\u305f\u7a92\u5316\u30ac\u30ea\u30a6\u30e0\u7cfbMOS-HEMT\u306b\u304a\u3051\u308bMOS\u754c\u9762\u6e96\u4f4d\u306e\u8a55\u4fa1\u3068\u5236\u5fa1\uff09\uff63<br>\u554f\u3044\u5408\u308f\u305b\u5148\uff1a\u3000Tel 011-706-6873, E-mail hashi@rciqe.hokudai.ac.jp<\/p>\n","protected":false},"featured_media":0,"template":"","topics_category":[7],"topics_tag":[9,11],"class_list":["post-2861","topics","type-topics","status-publish","hentry","topics_category-award","topics_tag-engineering","topics_tag-information_science"],"acf":[],"_links":{"self":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics\/2861","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/types\/topics"}],"wp:attachment":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/media?parent=2861"}],"wp:term":[{"taxonomy":"topics_category","embeddable":true,"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics_category?post=2861"},{"taxonomy":"topics_tag","embeddable":true,"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics_tag?post=2861"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}