{"id":995343,"date":"2026-10-01T10:02:00","date_gmt":"2026-10-01T01:02:00","guid":{"rendered":"https:\/\/pr.eng.hokudai.ac.jp\/top\/?post_type=topics&#038;p=995343"},"modified":"2026-10-09T13:39:34","modified_gmt":"2026-10-09T04:39:34","slug":"prize20261001_03","status":"publish","type":"topics","link":"https:\/\/pr.eng.hokudai.ac.jp\/top\/topics\/prize20261001_03\/","title":{"rendered":"\u60c5\u5831\u79d1\u5b66\u9662 Buchizya Kumwenda\u3055\u3093(\u535a\u58eb1\u5e74)\u304cThe 32nd International Council on Electrical Engineering Conference (ICEE 2026)\u306eExcellent Oral Presentation Award\u3092\u53d7\u8cde\u3057\u307e\u3057\u305f\u3002"},"content":{"rendered":"\n<figure class=\"wp-block-image size-large is-resized\"><img loading=\"lazy\" decoding=\"async\" width=\"724\" height=\"1024\" src=\"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-724x1024.jpg\" alt=\"\" class=\"wp-image-995370\" style=\"aspect-ratio:0.7070506454816285;width:181px;height:auto\" srcset=\"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-724x1024.jpg 724w, https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-212x300.jpg 212w, https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-768x1086.jpg 768w, https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-1086x1536.jpg 1086w, https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda-1448x2048.jpg 1448w, https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-content\/uploads\/2026\/10\/260912_Award_Kumwenda.jpg 1654w\" sizes=\"auto, (max-width: 724px) 100vw, 724px\" \/><\/figure>\n\n\n\n<p class=\"wp-block-paragraph\">\u53d7\u8cde\u65e5\uff1a2026\u5e7409\u670812\u65e5<br>\u6c0f\u540d\uff1aBuchizya Kumwenda<br>\u5b66\u5e74\uff1a\u535a\u58eb1\u5e74<br>\u6240\u5c5e\uff1a\u60c5\u5831\u79d1\u5b66\u9662\u60c5\u5831\u79d1\u5b66\u5c02\u653b\u30b7\u30b9\u30c6\u30e0\u60c5\u5831\u79d1\u5b66\u30b3\u30fc\u30b9 <a href=\"http:\/\/si.ssi.ist.hokudai.ac.jp\/index.html\" target=\"_blank\" rel=\"noopener\">\u96fb\u529b\u30b7\u30b9\u30c6\u30e0\u7814\u7a76\u5ba4<\/a><br>\u6388\u4e0e\u56e3\u4f53\uff1a<a href=\"https:\/\/www.icee2026.org\/\" target=\"_blank\" rel=\"noopener\">The 32nd International Council on Electrical Engineering Conference (ICEE 2026)<\/a><br>\u8cde\u540d\uff1aExcellent Oral Presentation Award<br>\u53d7\u8cde\u8ad6\u6587\u540d\uff1a<a href=\"https:\/\/www.icee2026.org\/main\/pr_awards.htm\" target=\"_blank\" rel=\"noopener\">Faulted Section Detection in an Islanded Microgrid by Harmonic Sweep Approach (\u9ad8\u8abf\u6ce2\u30b9\u30a4\u30fc\u30d7\u6cd5\u306b\u3088\u308b\u81ea\u7acb\u904b\u8ee2\u30de\u30a4\u30af\u30ed\u30b0\u30ea\u30c3\u30c9\u306e\u4e8b\u6545\u533a\u9593\u691c\u51fa)<\/a><br>\u554f\u3044\u5408\u308f\u305b\u5148\uff1aTel 011-706-6475 \/ E-mail hara[a]ssi.ist.hokudai.ac.jp\uff08\u539f \u4eae\u4e00\u3000\u51c6\u6559\u6388\uff09<\/p>\n","protected":false},"featured_media":0,"template":"","topics_category":[7],"topics_tag":[11],"class_list":["post-995343","topics","type-topics","status-publish","hentry","topics_category-award","topics_tag-information_science"],"acf":[],"_links":{"self":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics\/995343","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics"}],"about":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/types\/topics"}],"wp:attachment":[{"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/media?parent=995343"}],"wp:term":[{"taxonomy":"topics_category","embeddable":true,"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics_category?post=995343"},{"taxonomy":"topics_tag","embeddable":true,"href":"https:\/\/pr.eng.hokudai.ac.jp\/top\/wp-json\/wp\/v2\/topics_tag?post=995343"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}